Aligning apparatus and method using on-the-fly determination of throughput-profile gradient for current positioning of radiated influence supplier and/or receiver

Samples are taken of radiation throughput intensities while a radiation supplying, first element advances along a dithering displacement path, where the displacement path is spaced slightly away from but extends adjacent to an initial position of the first element and while a reference radiation sig...

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Bibliographic Details
Main Author JORDAN SCOTT C
Format Patent
LanguageEnglish
Published 26.06.2007
Subjects
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
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Summary:Samples are taken of radiation throughput intensities while a radiation supplying, first element advances along a dithering displacement path, where the displacement path is spaced slightly away from but extends adjacent to an initial position of the first element and while a reference radiation signal is coupled radiatively between the first element and a counterpart, radiation receiving, second element. Those samples that are seen to be the greatest (Imaxc) are identified. From this information, a determination is made of at least the approximate direction, if not the approximate length of an optimization vector which separates the initial position of the first element from a radiative coupling, new position having a greater coupling efficiency. The first element is automatically moved according to the optimization vector so as to be at or substantially close to the new radiative coupling position.
Bibliography:Application Number: US20040919694