Semiconductor device including dual damascene interconnections

A method (and structure) of forming an interconnect on a semiconductor substrate, includes forming a relatively narrow first structure in a dielectric formed on a semiconductor substrate, forming a relatively wider second structure in the dielectric formed on the semiconductor substrate, forming a l...

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Bibliographic Details
Main Authors NESBIT LARRY A, CLEVENGER LAWRENCE A
Format Patent
LanguageEnglish
Published 06.03.2007
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Summary:A method (and structure) of forming an interconnect on a semiconductor substrate, includes forming a relatively narrow first structure in a dielectric formed on a semiconductor substrate, forming a relatively wider second structure in the dielectric formed on the semiconductor substrate, forming a liner in the first and second structures such that the first structure is substantially filled and the second structure is substantially unfilled, and forming a metallization over the liner to completely fill the second structure.
Bibliography:Application Number: US20040853492