Angle-measurement device

An angle-measurement device comprising a carrier element with at least two tracers. At least one tracer is configured as an annular surface, and at least one tracer is configured as a cylindrical surface. Each tracer has essentially coinciding periodic patterns that are electromagnetically or optica...

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Bibliographic Details
Main Author SCHMIED BENNO
Format Patent
LanguageEnglish
Published 29.08.2006
Subjects
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
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Summary:An angle-measurement device comprising a carrier element with at least two tracers. At least one tracer is configured as an annular surface, and at least one tracer is configured as a cylindrical surface. Each tracer has essentially coinciding periodic patterns that are electromagnetically or optically detectable by at least one sensor, and one tracer has a number N of patterns and the other tracer has a number N+1 of patterns. In another embodiment, one tracer is disposed on one face and the other tracer is disposed on another face of an annular carrier element.
Bibliography:Application Number: US20050063243