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Summary:In a deposition method according to the present invention, a substrate ( 10 ) is first arranged in a processing vessel to carry out a heat-up step. Then, Si-containing gas, such as SiH4 gas, is supplied into the processing vessel to carry out an initiation step serving as a pretreating step on the substrate (ST 2 ). Then, a deposition gas is supplied into the processing vessel to carry out a deposition step (ST 3 ). By carrying out the initiation step (ST 2 ) by setting the partial pressure of the Si-containing gas to be not less than 50 Pa (not less than 100 Pa when the heat-up step is not carried out), it is possible to stably produce a film having a good surface condition.
Bibliography:Application Number: US20030333963