Determination of layer thickness or non-uniformity of layer thickness based on fluorophore additives

The invention provides a method for measuring the thickness, or non-uniformity of thickness, of one or more layers of a film or article such as a preform. At least one layer contains a known concentration and a substantially uniform distribution of fluorophores. The fluorophores are added to the one...

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Bibliographic Details
Main Authors NELSON GREGORY WAYNE, DONELSON MICHAEL EUGENE, HANSON SCOTT ARNOLD
Format Patent
LanguageEnglish
Published 08.11.2005
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:The invention provides a method for measuring the thickness, or non-uniformity of thickness, of one or more layers of a film or article such as a preform. At least one layer contains a known concentration and a substantially uniform distribution of fluorophores. The fluorophores are added to the one or more layers in sufficient quantity to impart fluorescence capable of detection by a detector when exposed to electromagnetic radiation at absorbing wavelengths. The layers of the invention may be made from polymeric material, non-polymeric material, or combinations thereof.
Bibliography:Application Number: US20000640318