Contact probe and probe device

• Main Authors: ISHII TOSHINORI, SASAKI HAYATO, YOSHIDA HIDEAKI, NAKAMURA TADASHI, MATSUDA ATUSHI, KATOU NAOKI, HIJI TOSHIHARU, UEKI MITUYOSHI, TACHIKAWA NORIYOSHI, MASUDA AKIHIRO, MISHIMA AKIHUMI, TAI SHOU, IWAMOTO NAOHUMI
• Format: Patent
• Language: English
• Published: 19.07.2005
• Edition: 7
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A probe device having a contact probe including a film, a plurality of wiring patterns formed on the film with each wiring pattern having a front end portion projecting from the film so as to form contact pins, and a metal layer provided on the film. In one embodiment, the contact probe device includes first and second contact probes connected to each other, the first contact probe including a first film, and a plurality of first wiring patterns formed on the first film, each first wiring pattern having a front end portion projecting from the first film so as to form contact pins. The second contact probe includes a second film, and a plurality of second wiring patterns formed on the second film. The plurality of second wiring patterns are connected to the plurality of first wiring patterns, and the second contact probe is formed separately from the first contact probe.