High-speed x-ray inspection apparatus and method

An apparatus and method for inspecting parts. The apparatus includes an x-ray source for illuminating a part from a plurality of locations with respect to the part and an imaging detector for forming a plurality of measured x-ray images of the part, one such measured x-ray image corresponding to eac...

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Bibliographic Details
Main Authors SHIH ANG, ROSNER S. JEFFREY
Format Patent
LanguageEnglish
Published 17.05.2005
Edition7
Subjects
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:An apparatus and method for inspecting parts. The apparatus includes an x-ray source for illuminating a part from a plurality of locations with respect to the part and an imaging detector for forming a plurality of measured x-ray images of the part, one such measured x-ray image corresponding to each of the illumination locations. A controller compares each of the measured x-ray images with a corresponding calibration image. The controller provides a defective part indication if one of the measured x-ray images differs from the corresponding calibration image by more than a threshold value in part of the measured x-ray image. The controller localizes defects on the part by comparing two or more of the measured x-ray images with two or more corresponding calibration images. The calibration images can be constructed from measured images of defect free parts.
Bibliography:Application Number: US20020302536