Connector cable and method for probing vacuum-sealable electronic nodes of an electrical testing device

• Main Authors: KING PHILIP N, SIEFERS JOHN E
• Format: Patent
• Language: English
• Published: 17.05.2005
• Edition: 7
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A novel thin wire connector cable and method for connecting an electrical test instrument to an electrical node of interest sealable within a vacuum chamber of an electrical testing device is presented. The thin wire connector cable includes a thin wire cable with a first end connectable to the test instrument and a second end comprising a connector electrically connectable to the electrical node of interest that lies within the vacuum-sealable chamber. The thin wire cable is routed from the vacuum-sealable chamber to the test instrument in between a flexible vacuum seal and an opening to the vacuum-sealable chamber such that when the vacuum is actuated, the thin wire cable is wedged between the seal and testing device. The thin wire cable is substantially thin enough so as to prevent more than a negligible amount of leakage between the thin wire cable and the flexible vacuum seal, which allows a vacuum to be generated and maintained.