Die-level prober

A die-level prober testing an unpackaged liquid crystal on silicon (LCOS) display panel includes a tray and a probe card. The unpackaged LCOS display panel has at least a first contact pad and a second contact pad. Additionally, the tray includes at least a recession for situating the unpackaged LCO...

Full description

Saved in:
Bibliographic Details
Main Authors HSU TUNG-JUNG, LIU SUNG-PIN, YEH CHI-HONE, YANG CHUANG-MING
Format Patent
LanguageEnglish
Published 29.03.2005
Edition7
Subjects
ADVERTISING
ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION
CRYPTOGRAPHY
DISPLAY
EDUCATION
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEALS
TESTING
Online AccessGet full text

Cover

More Information
Summary:A die-level prober testing an unpackaged liquid crystal on silicon (LCOS) display panel includes a tray and a probe card. The unpackaged LCOS display panel has at least a first contact pad and a second contact pad. Additionally, the tray includes at least a recession for situating the unpackaged LCOS display panel, and a conductive connecting structure electrically contacting the first contact pad. The probe card is utilized to electrically contact the connecting structure and the second contact pad for testing the unpackaged LCOS display panel.
Bibliography:Application Number: US20040710266