Voltage probe

A voltage probe includes a signal lead that is configured to be soldered to a probing location in a device that is to be probed by the voltage probe, and a first cable that is coupled to the signal lead and that is configured to conduct an output signal that is responsive to an input signal that is...

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Bibliographic Details
Main Author MCTIGUE MICHAEL THOMAS
Format Patent
LanguageEnglish
Published 08.03.2005
Edition7
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A voltage probe includes a signal lead that is configured to be soldered to a probing location in a device that is to be probed by the voltage probe, and a first cable that is coupled to the signal lead and that is configured to conduct an output signal that is responsive to an input signal that is received by the signal lead from the device. The signal lead has a thermal conductivity of less than 200 Watts per meter Kelvin (W/mK). Methods and other systems for providing electrical connections to devices under test are disclosed.
Bibliography:Application Number: US20020284832