Memory tester has memory sets configurable for use as error catch RAM, Tag RAM's, buffer memories and stimulus log RAM

The various functions that are desirable for interior test memory within a memory tester are implemented in Memory Sets each serving as the host for one or sometimes more of such functions. For certain classes of testing a portion of interior test memory can be used as a Stimulus Log RAM that operat...

Full description

Saved in:
Bibliographic Details
Main Authors SINGH PREET P, JORDAN STEPHEN D, COOK, III JOHN H
Format Patent
LanguageEnglish
Published 01.02.2005
Edition7
Subjects
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
Online AccessGet full text

Cover

More Information
Summary:The various functions that are desirable for interior test memory within a memory tester are implemented in Memory Sets each serving as the host for one or sometimes more of such functions. For certain classes of testing a portion of interior test memory can be used as a Stimulus Log RAM that operates as an ideal DUT to create the correct conditions that are to exist in an actual DUT after testing. The actual part can then be tested, while the expected receive vectors are taken from the Stimulus Log RAM, and the comparison results sent to an ECR, Tag RAM's, etc., as usual. In this way the test program does not have to create or contain within itself the particular receive vectors that are the expected response from the applied stimulus.
Bibliography:Application Number: US20000672650