Selective chemical-mechanical polishing properties of a cross-linked polymer and specific applications therefor

The present invention is directed, in general, to a method of polishing a surface on substrates, such as semiconductor wafers and, more specifically, to a polishing pad suitable for this purpose. The polishing pad comprises a polishing body that includes a cross-linked polymer material, and may be i...

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Bibliographic Details
Main Authors YOKLEY EDWARD M, OBENG YAW S
Format Patent
LanguageEnglish
Published 25.01.2005
Edition7
Subjects
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Summary:The present invention is directed, in general, to a method of polishing a surface on substrates, such as semiconductor wafers and, more specifically, to a polishing pad suitable for this purpose. The polishing pad comprises a polishing body that includes a cross-linked polymer material, and may be incorporated into a polishing apparatus. Polishing includes positioning the substrate containing at least one layer against the polishing body and polishing the layer.
Bibliography:Application Number: US20010000101