Selective chemical-mechanical polishing properties of a cross-linked polymer and specific applications therefor
The present invention is directed, in general, to a method of polishing a surface on substrates, such as semiconductor wafers and, more specifically, to a polishing pad suitable for this purpose. The polishing pad comprises a polishing body that includes a cross-linked polymer material, and may be i...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
25.01.2005
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Summary: | The present invention is directed, in general, to a method of polishing a surface on substrates, such as semiconductor wafers and, more specifically, to a polishing pad suitable for this purpose. The polishing pad comprises a polishing body that includes a cross-linked polymer material, and may be incorporated into a polishing apparatus. Polishing includes positioning the substrate containing at least one layer against the polishing body and polishing the layer. |
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Bibliography: | Application Number: US20010000101 |