Thermal management with filled polymeric polishing pads and applications therefor

The present invention is directed, in general, to a method of planarizing a surface on a semiconductor wafer and, more specifically, to a method of altering the properties of polishing pads to improve thermal management during chemical-mechanical planarization, the resulting heat conductive pad and...

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Bibliographic Details
Main Authors YOKLEY EDWARD M, OBENG YAW S
Format Patent
LanguageEnglish
Published 16.11.2004
Edition7
Subjects
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Summary:The present invention is directed, in general, to a method of planarizing a surface on a semiconductor wafer and, more specifically, to a method of altering the properties of polishing pads to improve thermal management during chemical-mechanical planarization, the resulting heat conductive pad and a polishing apparatus that includes the pad. The pad includes a polishing body composed of a thermoconductive polymer comprising an substrate and filler particle containing a Group II salt and within the substrate.
Bibliography:Application Number: US20020090397