Thermal management with filled polymeric polishing pads and applications therefor
The present invention is directed, in general, to a method of planarizing a surface on a semiconductor wafer and, more specifically, to a method of altering the properties of polishing pads to improve thermal management during chemical-mechanical planarization, the resulting heat conductive pad and...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
16.11.2004
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Summary: | The present invention is directed, in general, to a method of planarizing a surface on a semiconductor wafer and, more specifically, to a method of altering the properties of polishing pads to improve thermal management during chemical-mechanical planarization, the resulting heat conductive pad and a polishing apparatus that includes the pad. The pad includes a polishing body composed of a thermoconductive polymer comprising an substrate and filler particle containing a Group II salt and within the substrate. |
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Bibliography: | Application Number: US20020090397 |