Cleaning fluid and cleaning method for component of semiconductor-treating apparatus

A cleaning solution is used to remove a byproduct derived from a decomposed substance of a process gas containing C and F. The cleaning solution contains 75 wt % N-methyl-2-pyrrolidone, 15 wt % ethylene glycol monobutyl ether, 0.5 wt % surfactant, and 9.5 wt % water. The content of an alkali metal i...

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Main Authors YUASA KIYOSHI, NAGAYAMA NOBUYUKI, YAMADA HITOSHI, KAWAGUCHI SHINICHI, HIROTA KENICHI, YAMAGUCHI EIJI, SHIMODA TAKAHIRO
Format Patent
LanguageEnglish
Published 19.10.2004
Edition7
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Summary:A cleaning solution is used to remove a byproduct derived from a decomposed substance of a process gas containing C and F. The cleaning solution contains 75 wt % N-methyl-2-pyrrolidone, 15 wt % ethylene glycol monobutyl ether, 0.5 wt % surfactant, and 9.5 wt % water. The content of an alkali metal in the cleaning solution is set to be less than 10 ppb.
Bibliography:Application Number: US20000700704