System and method for leak rate testing during adiabatic cooling

A system for determining a leak rate of a device during an adiabatic cooling phase is provided. The system includes a leak rate training system receiving leak rate calibration data, such as pressure data or mass flow data for a device having a known leakage rate. The leak rate training system genera...

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Bibliographic Details
Main Authors EKBLAD MARK K, RUTHERFORD JAMES M
Format Patent
LanguageEnglish
Published 25.05.2004
Edition7
Subjects
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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Summary:A system for determining a leak rate of a device during an adiabatic cooling phase is provided. The system includes a leak rate training system receiving leak rate calibration data, such as pressure data or mass flow data for a device having a known leakage rate. The leak rate training system generates an adiabatic cooling model from the leak rate calibration data, such as by solving a finite difference equation for one or more unknown process variables that are dependent on the adiabatic cooling parameters of the device. The system further includes a leak rate detection system receiving the adiabatic cooling model and leak rate data and determining a leak rate component of the leak rate data using the adiabatic cooling model, such as by using the variable values determined through solving the finite difference model to interpolate between the leak rate calibration data that was gathered using known leakage rates.
Bibliography:Application Number: US20020087729