Reflective measuring scale graduation and method for its manufacture

A reflective measuring scale graduation, as well as a method for manufacturing the same are described. The reflective measuring scale graduation includes first and second subdivisions having different reflection properties, which extend in at least one first direction on a reflecting substrate. The...

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Bibliographic Details
Main Author FLATSCHER GEORG
Format Patent
LanguageEnglish
Published 30.12.2003
Edition7
Subjects
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TARIFF METERING APPARATUS
TESTING
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Summary:A reflective measuring scale graduation, as well as a method for manufacturing the same are described. The reflective measuring scale graduation includes first and second subdivisions having different reflection properties, which extend in at least one first direction on a reflecting substrate. The highly reflecting first subdivisions are made of a plurality of partial layers having different indices of refraction and function as an interference filter. The low reflecting second subdivisions are composed of at least one absorber layer on the substrate.
Bibliography:Application Number: US20010801449