Thin-film interference filter with quarter-wavelength unit sub-layers arranged in a generalized pattern

Thin-film interference filters are constructed with a generalized pattern of layers differing in both thickness and refractive index to produce spectral responses appropriate for adjusting optical power among a plurality of different wavelength channels. Each of the layers is composed of unit sub-la...

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Bibliographic Details
Main Authors ERDOGAN TURAN, WANG LIGANG
Format Patent
LanguageEnglish
Published 26.08.2003
Edition7
Subjects
GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TECHNICAL SUBJECTS COVERED BY FORMER USPC
TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ARTCOLLECTIONS [XRACs] AND DIGESTS
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Summary:Thin-film interference filters are constructed with a generalized pattern of layers differing in both thickness and refractive index to produce spectral responses appropriate for adjusting optical power among a plurality of different wavelength channels. Each of the layers is composed of unit sub-layers having thicknesses equal to a quarter-wavelength thickness of a monitoring beam. Interference fluctuations of the monitoring beam associated with the deposition of the unit sub-layers enable a gain-flattening filter to achieve greater manufacturing accuracy by exploiting self-correcting effects of "turning point monitoring" techniques.
Bibliography:Application Number: US20010028031