Field effect transistor and method of fabricating the same
There is provided a field effect transistor including a semi-insulating semiconductor substrate formed with a recess at a region in which a gate is to be formed, a gate base layer formed on the recess and composed of one of an InP layer and a plurality of layers including an InP layer, and a gate el...
Saved in:
Main Author | |
---|---|
Format | Patent |
Language | English |
Published |
10.09.2002
|
Edition | 7 |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | There is provided a field effect transistor including a semi-insulating semiconductor substrate formed with a recess at a region in which a gate is to be formed, a gate base layer formed on the recess and composed of one of an InP layer and a plurality of layers including an InP layer, and a gate electrode formed on the gate base layer. The InP layer may be replaced with an InGaP layer, an AlXGa1-XAs (0<=X<=1) layer, an InXGa1-XAs (0<=X<=1) layer, or an InXAl1-XAs (0<=X<0.4 or 0.6<X<=1) layer. The above-mentioned field effect transistor prevents thermal instability thereof caused by impurities such as fluorine entering a donor layer to thereby inactivate donor. As a result, there is presented a highly reliable compound field effect transistor. |
---|---|
Bibliography: | Application Number: US20000667231 |