Servo control method and its application in a lithographic apparatus
In a photolithography apparatus, accelerations of the lens unit due to vibrational disturbances are measured and used to derive a control signal which is applied to the positioning means of the wafer table and/or mask table, so as to effect compensating motions of that table. This feedforward system...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
16.07.2002
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Summary: | In a photolithography apparatus, accelerations of the lens unit due to vibrational disturbances are measured and used to derive a control signal which is applied to the positioning means of the wafer table and/or mask table, so as to effect compensating motions of that table. This feedforward system can be optimized to correct for motions of the lens unit in specific frequency bands, e.g. in the vicinity of the eigenfrequency of the lens. |
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Bibliography: | Application Number: US19990460800 |