Built-in self test for multiple memories in a chip

• Main Authors: LEE KUEN-JONG, WU JING-YANE, JONE WEN-BEN
• Format: Patent
• Language: English
• Published: 19.03.2002
• Edition: 7
• Subjects: INFORMATION STORAGE; PHYSICS; STATIC STORES

A new built-in self-test architecture for multiple memories in a chip is proposed in the present invention. In this architecture, all memories under test are tested in parallel using only one address generator. When the address generated from the address generator exceeds one memory's address space the memory is turned off by a BIST controller. Each word in each memory is tested by a scan-in/out method. That is, the D flip-flops in the input and output ports of each memory are connected in series and form two scan chains, respectively. Only one data input and one data output are required for the scan chains of each memory. The outputs of all scan chains are connected to a self checker for fault analysis in parallel. The address generator, data generator, self checker and the test controller are all built in a chip to satisfy the requirement of built-in self-testing.