Modified gate conductor processing for poly length control in high density DRAMS

A semiconductor device includes a semiconductor substrate having an oxide layer thereon. A gate conductor is provided on the oxide layer, the gate conductor including a layer of polysilicon on the oxide layer, a tungsten silicide layer on the polysilicon layer, and a nitride cap layer on the tungste...

Full description

Saved in:
Bibliographic Details
Main Authors DIVAKARUNI RAMACHANDRA, WEYBRIGHT MARY E
Format Patent
LanguageEnglish
Published 12.02.2002
Edition7
Subjects
Online AccessGet full text

Cover

Loading…