Apparatus for thermally testing an electronic device

A turbulent plate is installed nearby the heat source of an apparatus for thermally testing an electronic device. The testing apparatus comprises a main body and a pallet. The main body is formed with a first chamber for receiving the electronic device, and a second chamber located around and commun...

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Bibliographic Details
Main Author WU WEN-SHIEN
Format Patent
LanguageEnglish
Published 08.05.2001
Edition7
Subjects
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Summary:A turbulent plate is installed nearby the heat source of an apparatus for thermally testing an electronic device. The testing apparatus comprises a main body and a pallet. The main body is formed with a first chamber for receiving the electronic device, and a second chamber located around and communicated with the first chamber. The pallet having a plate mounted with window and a through hole filled with corrugated heat insulators, supports the electronic device, which is turned on and received in the first chamber. The status of the electronic device can be inspected through the window. The heat insulators fully envelop a lead wire passed the through hole and connected between the portable computer and a power supply.
Bibliography:Application Number: US19990368357