Relating to the measurement of particle size distribution

A particle size distribution analysis apparatus wherein there are provided a sample measurement zone adapted to contain a sample of particles, a light emitting means adapted to provide a source of light incident upon the measurement zone, and a detection means adapted to measure light levels at diff...

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Bibliographic Details
Main Authors CATTERALL CLIVE PATRICK ASHLEY, WATSON DAVID JOHN, STEPHENSON DUNCAN EDWARD
Format Patent
LanguageEnglish
Published 23.01.2001
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A particle size distribution analysis apparatus wherein there are provided a sample measurement zone adapted to contain a sample of particles, a light emitting means adapted to provide a source of light incident upon the measurement zone, and a detection means adapted to measure light levels at different scattering angles and to output signals to a computation means, enabling the size of particles contained within the sample to be determined, wherein the light emitting means comprises a first light source emitting a substantially monochromatic first wavelength of light and a second light source emitting a substantially monochromatic second, different, wavelength of light.
Bibliography:Application Number: US19990378338