Process and arrangement for laser-induced spectral analysis

PCT No. PCT/EP97/03360 Sec. 371 Date Nov. 30, 1998 Sec. 102(e) Date Nov. 30, 1998 PCT Filed Jun. 26, 1997 PCT Pub. No. WO98/00702 PCT Pub. Date Jan. 8, 1998A pulsed laser is employed for quantitative spectral analysis of halogen-containing, nonmetallic or at most partially metallic materials in comb...

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Bibliographic Details
Main Authors MUELLER; NORBERT, ROHR; KLAUS, EICHER; JOCHEN
Format Patent
LanguageEnglish
Published 30.05.2000
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PCT No. PCT/EP97/03360 Sec. 371 Date Nov. 30, 1998 Sec. 102(e) Date Nov. 30, 1998 PCT Filed Jun. 26, 1997 PCT Pub. No. WO98/00702 PCT Pub. Date Jan. 8, 1998A pulsed laser is employed for quantitative spectral analysis of halogen-containing, nonmetallic or at most partially metallic materials in combination with an image recorder, a spectrometer and a CCD camera, by detecting, summing and analysing the luminous intensity of at least a volume slice from the expansion cone of the plasma, this making it possible, advantageously, for temperature and density gradients to be measured.
Bibliography:Application Number: US19980194590