Method and apparatus for facilitating detection of solder opens of SMT components
A split-pad land pattern configured to facilitate electrical testing of an interconnection between a single electrical contact of a surface mount technology component and a printed circuit board. The split-pad land pattern comprises at least one split mounting pad including at least a first and seco...
Saved in:
Main Authors | , |
---|---|
Format | Patent |
Language | English |
Published |
12.10.1999
|
Edition | 6 |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | A split-pad land pattern configured to facilitate electrical testing of an interconnection between a single electrical contact of a surface mount technology component and a printed circuit board. The split-pad land pattern comprises at least one split mounting pad including at least a first and second mounting pads coupled to a single electrical contact. The mounting pads are further coupled to corresponding access pads so that a first access pad is coupled to the first mounting pad while a second access pad is coupled to the second mounting pad. Electrical testing of the single electrical contact is possible through the completed circuit between the two access pads. |
---|---|
Bibliography: | Application Number: US19960741053 |