Method and apparatus for using parameters to simulate an electronic circuit
The present disclosure provides a method and apparatus for using frequency domain data, such as S-parameters, in a time-based simulator. S-parameters are either input to the simulator, or are empirically measured, at selected frequencies. Preferably, the selected frequencies are related to one anoth...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
31.08.1999
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Edition | 6 |
Subjects | |
Online Access | Get full text |
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Summary: | The present disclosure provides a method and apparatus for using frequency domain data, such as S-parameters, in a time-based simulator. S-parameters are either input to the simulator, or are empirically measured, at selected frequencies. Preferably, the selected frequencies are related to one another by a logarithmic scale, providing for determination of a system transfer function which is accurate across a very wide range of frequencies, from near zero hertz, to frequencies on the order of a hundred gigahertz. The transfer function preferably takes the form of a fitted polynomial, obtained using FDSI techniques. In addition, recursive convolution may be employed to operate in the time domain on inverse Laplace Transforms of the fitted transfer function and time-domain simulator test signals. This disclosure provides for circuit modeling and simulation which is accurate across a wide frequency range, which is stable for transfer functions of high order, and which is quickly and efficiently performed for large circuits. |
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Bibliography: | Application Number: US19970857427 |