Probe for memory device having movable media

• Main Author: YI; YOU-WEN
• Format: Patent
• Language: English
• Published: 12.05.1998
• Edition: 6
• Subjects: APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]; INFORMATION STORAGE; INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; SCANNING-PROBE TECHNIQUES OR APPARATUS; TESTING

A buffered probing device includes a cantilever-shaped probe having a micro-needle at its tip, and an electric circuit that applies electrical signals between the micro-needle and a probe target to which an electrical stimulus is applied. In one embodiment of the invention, the probe includes a suspension member having a spring constant per unit length that is less than that of a probe body. The micro-needle is formed on the suspension member. In another embodiment of the invention, the electric circuit applies oscillations at a specific frequency to the probe, such that the micro-needle is always or intermittently in contact with the surface of the probe target. As a result, wear of the needle is greatly reduced.