Probe for memory device having movable media

A buffered probing device includes a cantilever-shaped probe having a micro-needle at its tip, and an electric circuit that applies electrical signals between the micro-needle and a probe target to which an electrical stimulus is applied. In one embodiment of the invention, the probe includes a susp...

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Bibliographic Details
Main Author YI; YOU-WEN
Format Patent
LanguageEnglish
Published 12.05.1998
Edition6
Subjects
APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
INFORMATION STORAGE
INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
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Summary:A buffered probing device includes a cantilever-shaped probe having a micro-needle at its tip, and an electric circuit that applies electrical signals between the micro-needle and a probe target to which an electrical stimulus is applied. In one embodiment of the invention, the probe includes a suspension member having a spring constant per unit length that is less than that of a probe body. The micro-needle is formed on the suspension member. In another embodiment of the invention, the electric circuit applies oscillations at a specific frequency to the probe, such that the micro-needle is always or intermittently in contact with the surface of the probe target. As a result, wear of the needle is greatly reduced.
Bibliography:Application Number: US19960644385