Circuit and method to externally adjust internal circuit timing

• Main Authors: KIRIHATA; TOSHIAKI, WONG; HING, KRSNIK; BOZIDAR
• Format: Patent
• Language: English
• Published: 28.04.1998
• Edition: 6
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; INFORMATION STORAGE; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; STATIC STORES; TESTING

A circuit and method of using a test mode to control the timing of an internal signal using an external control in an integrated circuit. The test mode is designed such that the timing of the internal signal is derived from the external control which can be arbitrarily controlled by a tester. The ex...