Method for quantitative analysis of earth samples

A method and apparatus for analyzing a sample to determine its mineral composition. The invention combines X-ray diffraction with Fourier transform infrared spectroscopy to provide a complete spectrum including molecular vibrations, probed by FTIR scans and lattice spacing measured by X-ray diffract...

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Bibliographic Details
Main Authors HERRON; MICHAEL M, SUPP; MICHAEL, MATTESON; ABIGAIL
Format Patent
LanguageEnglish
Published 21.04.1998
Edition6
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A method and apparatus for analyzing a sample to determine its mineral composition. The invention combines X-ray diffraction with Fourier transform infrared spectroscopy to provide a complete spectrum including molecular vibrations, probed by FTIR scans and lattice spacing measured by X-ray diffraction in a single representation. This FX spectrum provides a more complete and accurate mineralogy than either of the techniques alone. In addition, new techniques for independent X-ray diffraction analysis and FTIR analysis are described.
Bibliography:Application Number: US19940265175