Nonvolatile semiconductor memory cell capable of saving overwritten cell and its saving method

If data is read from a selected memory cell at the time of overwrite verifying, a potential of a bit line is changed in accordance with data. If a transistor is turned on, a latch circuit is set in accordance with data of the bit line. In a case where there is a memory cell being in an overwrite sta...

Full description

Saved in:
Bibliographic Details
Main Authors IMAMIYA; KENITI, NAKAMURA; HIROSHI
Format Patent
LanguageEnglish
Published 25.11.1997
Edition6
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:If data is read from a selected memory cell at the time of overwrite verifying, a potential of a bit line is changed in accordance with data. If a transistor is turned on, a latch circuit is set in accordance with data of the bit line. In a case where there is a memory cell being in an overwrite state, data of the selected memory cell is latched to the latch circuit, and data corresponding to one page is erased. Thereafter, a normally writing operation is executed by data latch to the latch circuit, thereby the memory cell being in the overwrite state can be used as a normal threshold voltage.
Bibliography:Application Number: US19950534339