Nonvolatile semiconductor memory cell capable of saving overwritten cell and its saving method
If data is read from a selected memory cell at the time of overwrite verifying, a potential of a bit line is changed in accordance with data. If a transistor is turned on, a latch circuit is set in accordance with data of the bit line. In a case where there is a memory cell being in an overwrite sta...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
25.11.1997
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Edition | 6 |
Subjects | |
Online Access | Get full text |
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Summary: | If data is read from a selected memory cell at the time of overwrite verifying, a potential of a bit line is changed in accordance with data. If a transistor is turned on, a latch circuit is set in accordance with data of the bit line. In a case where there is a memory cell being in an overwrite state, data of the selected memory cell is latched to the latch circuit, and data corresponding to one page is erased. Thereafter, a normally writing operation is executed by data latch to the latch circuit, thereby the memory cell being in the overwrite state can be used as a normal threshold voltage. |
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Bibliography: | Application Number: US19950534339 |