Yield surface modeling methodology
A method for predicting yields for integrated circuit designs for given specification limits and process variations with respect to transistor parametric variations is based on a stastical analysis starting with response surface modeling techniques that relate desired circuit outcomes as a function...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
01.08.1995
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Edition | 6 |
Subjects | |
Online Access | Get full text |
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