Multiple surface evanescent wave sensor with a reference

An evanescent wave sensor and method for use in analyzing one or more media, the sensor including a waveguide having first and second wave propagating surfaces. The waveguide propagates an input signal along the waveguide between the first and second surfaces. The first surface receives a first radi...

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Bibliographic Details
Main Authors LOVE; WALTER F, WALCZAK; IRENE M, SLOVACEK; RUDOLF E, SCHULKIND; RICHARD L, COOK; THOMAS A
Format Patent
LanguageEnglish
Published 23.08.1994
Edition5
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:An evanescent wave sensor and method for use in analyzing one or more media, the sensor including a waveguide having first and second wave propagating surfaces. The waveguide propagates an input signal along the waveguide between the first and second surfaces. The first surface receives a first radiation signal which indicates the presence of a first analyte, and the second surface receives a second radiation signal representing one or both of a second analyte and a reference. The first and second surfaces can both be contacted with a single medium, or with two separate media, and one or more output signals can be detected.
Bibliography:Application Number: US19910711783