Method of locating a fault in a logic IC device

A fault in a logic IC device including a plurality of logic cells is diagnosed by the use of an intentional fault. The intentional fault is introduced into a portion of logical operation data for the logic cells of the device to produce a faulty logical operation data. That portion of the logical op...

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Bibliographic Details
Main Authors IKEDA; MASAHARU, FUNABIKI; TAKAHIRO, KASUGA; KAZUO
Format Patent
LanguageEnglish
Published 23.02.1993
Subjects
BASIC ELECTRIC ELEMENTS
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:A fault in a logic IC device including a plurality of logic cells is diagnosed by the use of an intentional fault. The intentional fault is introduced into a portion of logical operation data for the logic cells of the device to produce a faulty logical operation data. That portion of the logical operation data corresponds to a fault candidate which represents a location in the device at which hazard is supposed to have occurred to make it uncertain whether or not a fault exists at the location.
Bibliography:Application Number: US19910772412