Matching of resistor sensitivities to process-induced variations in resistor widths

A method is disclosed for matching the sensitivities of different-sized resistors to changes in resistance due to changes in width resulting from a systematic manufacturing error. In order to produce sets of resistors which can be deployed in predetermined ratios of resistance, the sensitivities of...

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Bibliographic Details
Main Author BROKAW; ADRIAN P
Format Patent
LanguageEnglish
Published 29.04.1986
Edition4
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
RESISTORS
SEMICONDUCTOR DEVICES
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Summary:A method is disclosed for matching the sensitivities of different-sized resistors to changes in resistance due to changes in width resulting from a systematic manufacturing error. In order to produce sets of resistors which can be deployed in predetermined ratios of resistance, the sensitivities of a matching resistor and a reference resistor are equalized by forming the matching resistor as a plurality of parallel strips as opposed to a unitary rectangular section.
Bibliography:Application Number: US19850765809