Process and device for the analysis of the heterogeneous features in a transparent material

The invention relates to the analysis of defects in materials such as molten glass. According to the invention, the material passes by a monochrome beam the wavelength of which is below 3x10-6 m. The radiation is diffused by any defects present in the material. The analysis of the defects is conduct...

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Bibliographic Details
Main Authors PICHON; MICHEL, MAILLARD; ALAIN
Format Patent
LanguageEnglish
Published 17.09.1985
Edition4
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:The invention relates to the analysis of defects in materials such as molten glass. According to the invention, the material passes by a monochrome beam the wavelength of which is below 3x10-6 m. The radiation is diffused by any defects present in the material. The analysis of the defects is conducted dependent on the position of the receiver detecting the diffused rays and on the shape of the signal received. The invention permits a continuous analysis of a flow of glass supplying a fiber-making machine.
Bibliography:Application Number: US19830554957