Retroreflectance measurement system

A retroreflector evaluation system is disclosed as incorporating a laser and a plurality of laser light processing optical elements associated therewith in such manner as will permit the making of reflectance measurements at any or all points on the surface of retroreflective or other reflective sam...

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Bibliographic Details
Main Authors BREGLIA, DENIS R, DERDERIAN, GEORGE
Format Patent
LanguageEnglish
Published 23.10.1979
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A retroreflector evaluation system is disclosed as incorporating a laser and a plurality of laser light processing optical elements associated therewith in such manner as will permit the making of reflectance measurements at any or all points on the surface of retroreflective or other reflective samples or devices, thereby providing an indication of the intensity, uniformity, and other reflectance characteristics which determine the quality thereof.
Bibliography:Application Number: US19770789161