FEATURE PARAMETER MEASUREMENT BY LINE SCANNING

Methods and apparatus are described by which various dimensional measurements of features can be made using electrical pulses obtained from a video signal itself obtained by scanning the field or an image thereof.

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Bibliographic Details
Main Authors GARDNER G,GB, GIBBARD D,GB
Format Patent
LanguageEnglish
Published 19.06.1973
Subjects
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Summary:Methods and apparatus are described by which various dimensional measurements of features can be made using electrical pulses obtained from a video signal itself obtained by scanning the field or an image thereof.
Bibliography:Application Number: USD3740468