FEATURE PARAMETER MEASUREMENT BY LINE SCANNING
Methods and apparatus are described by which various dimensional measurements of features can be made using electrical pulses obtained from a video signal itself obtained by scanning the field or an image thereof.
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
19.06.1973
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Subjects | |
Online Access | Get full text |
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Summary: | Methods and apparatus are described by which various dimensional measurements of features can be made using electrical pulses obtained from a video signal itself obtained by scanning the field or an image thereof. |
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Bibliography: | Application Number: USD3740468 |