SPECIMEN STAGE FOR AN ELECTRON MICROSCOPE
A specimen stage for an electron microscope which allows tilting and translation of the specimen. The translation does not shift the tilt axes. Thus, once the point of intersection of the tilt axes is aligned with the optical axis, it will remain aligned irrespective of subsequent translation of the...
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| Main Author | |
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| Format | Patent |
| Language | English |
| Published |
07.11.1972
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| Subjects | |
| Online Access | Get full text |
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| Abstract | A specimen stage for an electron microscope which allows tilting and translation of the specimen. The translation does not shift the tilt axes. Thus, once the point of intersection of the tilt axes is aligned with the optical axis, it will remain aligned irrespective of subsequent translation of the specimen. Thus, tilting of the specimen will not affect the field of view. The stage comprises first and second gimbals, the second gimbal carrying a specimen mounting. The second gimbal can be translated with respect to the first gimbal along the second gimbal axis. The specimen mounting can be translated with respect to the second gimbal in a direction inclined to the second gimbal axis. In a preferred embodiment, the first gimbal is a tube, and the second gimbal is an annulus supported within the tube. |
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| AbstractList | A specimen stage for an electron microscope which allows tilting and translation of the specimen. The translation does not shift the tilt axes. Thus, once the point of intersection of the tilt axes is aligned with the optical axis, it will remain aligned irrespective of subsequent translation of the specimen. Thus, tilting of the specimen will not affect the field of view. The stage comprises first and second gimbals, the second gimbal carrying a specimen mounting. The second gimbal can be translated with respect to the first gimbal along the second gimbal axis. The specimen mounting can be translated with respect to the second gimbal in a direction inclined to the second gimbal axis. In a preferred embodiment, the first gimbal is a tube, and the second gimbal is an annulus supported within the tube. |
| Author | JEFFREY HARVEY LUCAS |
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| PublicationDate | 19721107 |
| PublicationDateYYYYMMDD | 1972-11-07 |
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| PublicationDecade | 1970 |
| PublicationYear | 1972 |
| RelatedCompanies | ASSOCIATED ELECTRICAL IND. LTD |
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| Snippet | A specimen stage for an electron microscope which allows tilting and translation of the specimen. The translation does not shift the tilt axes. Thus, once the... |
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| SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY |
| Title | SPECIMEN STAGE FOR AN ELECTRON MICROSCOPE |
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