SPECIMEN STAGE FOR AN ELECTRON MICROSCOPE

A specimen stage for an electron microscope which allows tilting and translation of the specimen. The translation does not shift the tilt axes. Thus, once the point of intersection of the tilt axes is aligned with the optical axis, it will remain aligned irrespective of subsequent translation of the...

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Bibliographic Details
Main Author JEFFREY HARVEY LUCAS
Format Patent
LanguageEnglish
Published 07.11.1972
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
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Summary:A specimen stage for an electron microscope which allows tilting and translation of the specimen. The translation does not shift the tilt axes. Thus, once the point of intersection of the tilt axes is aligned with the optical axis, it will remain aligned irrespective of subsequent translation of the specimen. Thus, tilting of the specimen will not affect the field of view. The stage comprises first and second gimbals, the second gimbal carrying a specimen mounting. The second gimbal can be translated with respect to the first gimbal along the second gimbal axis. The specimen mounting can be translated with respect to the second gimbal in a direction inclined to the second gimbal axis. In a preferred embodiment, the first gimbal is a tube, and the second gimbal is an annulus supported within the tube.
Bibliography:Application Number: USD3702399