Inside micrometer

Saved in:
Bibliographic Details
Main Author HICKS MARVIN R
Format Patent
LanguageEnglish
Published 12.08.1952
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Bibliography:Application Number: US19470767889