METHOD FOR ANALYZING SPECIMEN

Disclosed is a method for analyzing a specimen, comprising: acquiring first fluorescence information, second fluorescence information, and scattered light information generated by irradiating a particle in a measurement sample stained with a first fluorescent dye and a second fluorescent dye with li...

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Bibliographic Details
Main Authors TOYA, Yuji, Kanemura, Emi
Format Patent
LanguageEnglish
Published 03.10.2024
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:Disclosed is a method for analyzing a specimen, comprising: acquiring first fluorescence information, second fluorescence information, and scattered light information generated by irradiating a particle in a measurement sample stained with a first fluorescent dye and a second fluorescent dye with light; specifying a particle having a first characteristic based on the first fluorescence information, the second fluorescence information, and the scattered light information; and outputting information indicating presence or absence of a first abnormal cell, information indicating presence or absence of a second abnormal cell, and information indicating presence or absence of a third abnormal cell based on information of the particle having a first characteristic.
Bibliography:Application Number: US202418616847