METHOD, DEVICE, AND SYSTEM FOR ESTIMATING THRESHOLD VALUE OF KERNEL DENSITY FUNCTION WITH RESPECT TO DEFECT OF PRODUCT
Provided are a method, a device, and a system for estimating threshold values of a kernel density function with respect to defects of a product. The method includes a bootstrapping sampling operation, estimating optimal kernel bandwidths for sample data sets by using a bandwidth estimation method se...
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Main Authors | , , , , , |
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Format | Patent |
Language | English |
Published |
26.09.2024
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Subjects | |
Online Access | Get full text |
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Summary: | Provided are a method, a device, and a system for estimating threshold values of a kernel density function with respect to defects of a product. The method includes a bootstrapping sampling operation, estimating optimal kernel bandwidths for sample data sets by using a bandwidth estimation method selected according to a number of sample data from among a plurality of bandwidth estimation methods, estimating threshold values corresponding to a tail region of the kernel density function based on the optimal kernel bandwidths, and providing a quantitative value for quantifying uncertainty of the threshold values based on the plurality of threshold values. |
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Bibliography: | Application Number: US202318544065 |