METHOD, DEVICE, AND SYSTEM FOR ESTIMATING THRESHOLD VALUE OF KERNEL DENSITY FUNCTION WITH RESPECT TO DEFECT OF PRODUCT

Provided are a method, a device, and a system for estimating threshold values of a kernel density function with respect to defects of a product. The method includes a bootstrapping sampling operation, estimating optimal kernel bandwidths for sample data sets by using a bandwidth estimation method se...

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Bibliographic Details
Main Authors Choe, Jaemyung, Huh, In, Cha, Moonhyun, An, Taeyoon, Bae, Sangjune, You, Joohyung
Format Patent
LanguageEnglish
Published 26.09.2024
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:Provided are a method, a device, and a system for estimating threshold values of a kernel density function with respect to defects of a product. The method includes a bootstrapping sampling operation, estimating optimal kernel bandwidths for sample data sets by using a bandwidth estimation method selected according to a number of sample data from among a plurality of bandwidth estimation methods, estimating threshold values corresponding to a tail region of the kernel density function based on the optimal kernel bandwidths, and providing a quantitative value for quantifying uncertainty of the threshold values based on the plurality of threshold values.
Bibliography:Application Number: US202318544065