METHOD AND APPARATUS WITH DEFECT DETECTION

A processor-implemented method including performing an iterative training operation of a defect detection model which includes randomly assigning a label for a detected defect pattern of an object having a defect to training data responsive to the detected defect pattern being determined to be a def...

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Main Authors HAN, Seungju, PARK, Hyeon Jeong, MOON, Sanghyuk, HONG, Je Hyeong
Format Patent
LanguageEnglish
Published 01.08.2024
Subjects
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Abstract A processor-implemented method including performing an iterative training operation of a defect detection model which includes randomly assigning a label for a detected defect pattern of an object having a defect to training data responsive to the detected defect pattern being determined to be a defect pattern that is not among the training data, dependent on the label being determined to be a new label, generating an importance score, which represents a frequency of an occurrence of the defect pattern, and executing the training of the defect detection model using the defect data of the defect pattern when the importance score exceeds the first threshold value, and deleting the defect data when the importance score does not exceed the first threshold.
AbstractList A processor-implemented method including performing an iterative training operation of a defect detection model which includes randomly assigning a label for a detected defect pattern of an object having a defect to training data responsive to the detected defect pattern being determined to be a defect pattern that is not among the training data, dependent on the label being determined to be a new label, generating an importance score, which represents a frequency of an occurrence of the defect pattern, and executing the training of the defect detection model using the defect data of the defect pattern when the importance score exceeds the first threshold value, and deleting the defect data when the importance score does not exceed the first threshold.
Author MOON, Sanghyuk
PARK, Hyeon Jeong
HONG, Je Hyeong
HAN, Seungju
Author_xml – fullname: HAN, Seungju
– fullname: PARK, Hyeon Jeong
– fullname: MOON, Sanghyuk
– fullname: HONG, Je Hyeong
BookMark eNrjYmDJy89L5WTQ8nUN8fB3UXD0A-KAAMcgx5DQYIVwzxAPBRdXN1fnECAVAqQ8_f14GFjTEnOKU3mhNDeDsptriLOHbmpBfnxqcUFicmpeakl8aLCRgZGJkam5sZGlo6ExcaoAxfAnNg
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID US2024257329A1
GroupedDBID EVB
ID FETCH-epo_espacenet_US2024257329A13
IEDL.DBID EVB
IngestDate Fri Sep 20 10:17:40 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US2024257329A13
Notes Application Number: US202318357475
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240801&DB=EPODOC&CC=US&NR=2024257329A1
ParticipantIDs epo_espacenet_US2024257329A1
PublicationCentury 2000
PublicationDate 20240801
PublicationDateYYYYMMDD 2024-08-01
PublicationDate_xml – month: 08
  year: 2024
  text: 20240801
  day: 01
PublicationDecade 2020
PublicationYear 2024
RelatedCompanies IUCF-HYU(Industry-University Cooperation Foundation Hanyang University)
SAMSUNG ELECTRONICS CO., LTD
RelatedCompanies_xml – name: IUCF-HYU(Industry-University Cooperation Foundation Hanyang University)
– name: SAMSUNG ELECTRONICS CO., LTD
Score 3.5607028
Snippet A processor-implemented method including performing an iterative training operation of a defect detection model which includes randomly assigning a label for a...
SourceID epo
SourceType Open Access Repository
SubjectTerms CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
Title METHOD AND APPARATUS WITH DEFECT DETECTION
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240801&DB=EPODOC&locale=&CC=US&NR=2024257329A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_G_HzTqkydUlD6IBTp17Y-FOnalCr0gzXVvY21TUGQbtiK_77X2Ome9hBCcnD5IJfLJb-7ANyjycCwg4asG1op68WoDXmbjeSSFUxlSJyorb9zEI78VH-ZG_MefGx8YXic0G8eHBElKkd5b_h-vf6_xHI5trJ-zN6xavXkUcuVOuu4jdeFtrE7tUgcuZEjOY6VJlI44zRcnZpq2mgr7eFBetwCwMjrtPVLWW8rFe8E9mPkVzWn0GOVAEfO5u81AQ6D7slbgAOO0cxrrOzksD6Dh4BQP3JFO8QUx_bMpmkivj1TX3SJRxyKGSUcH3IOdx6hji9j84u_0S7SZLuv2gX0q1XFBiBqhpIbZWYuS7XUFXNpasVkXDCmKBoSVPMShrs4Xe0mX8NxW_zFtg2h33x-sRvUt012y6fpB2dofp8
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1bS8MwFD6MeZlvWhUvUwvKHoQivbo-FOnalE7Xrmyp7q2sbQqCdMNV_Puexk73tIcQyAcnF3KSnOScLwB3aDIwbKAuabpaSFpu1JS3qSEVLGcKQ7Cv1PHOQWj4sfY802ct-FjHwnCe0G9OjogalaG-V3y9Xv5fYrnct3L1kL5j0eLJo5bba6zjmq8LbWN3YJFo7I6dnuNY8bQXTjiGs1NVTBttpR08ZPdrpn3yOqjjUpabm4p3CLsRyiurI2ixUoCOs_57TYD9oHnyFmCP-2hmKyxs9HB1DPcBof7YFe0QUxTZE5vGU_FtSH3RJR5xKGaUcP-QE7j1CHV8CatP_nqbxNPNtqqn0C4XJTsDUdXlTC9Sc14ohSabc1PN-485Y7KsIqCY59DdJuliO3wDHZ8Go2Q0DF8u4aCGfv3cutCuPr_YFe69VXrNh-wHf2qBjw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=METHOD+AND+APPARATUS+WITH+DEFECT+DETECTION&rft.inventor=HAN%2C+Seungju&rft.inventor=PARK%2C+Hyeon+Jeong&rft.inventor=MOON%2C+Sanghyuk&rft.inventor=HONG%2C+Je+Hyeong&rft.date=2024-08-01&rft.externalDBID=A1&rft.externalDocID=US2024257329A1