METHOD AND APPARATUS WITH DEFECT DETECTION

A processor-implemented method including performing an iterative training operation of a defect detection model which includes randomly assigning a label for a detected defect pattern of an object having a defect to training data responsive to the detected defect pattern being determined to be a def...

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Bibliographic Details
Main Authors HAN, Seungju, PARK, Hyeon Jeong, MOON, Sanghyuk, HONG, Je Hyeong
Format Patent
LanguageEnglish
Published 01.08.2024
Subjects
CALCULATING
COMPUTING
COUNTING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
PHYSICS
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Summary:A processor-implemented method including performing an iterative training operation of a defect detection model which includes randomly assigning a label for a detected defect pattern of an object having a defect to training data responsive to the detected defect pattern being determined to be a defect pattern that is not among the training data, dependent on the label being determined to be a new label, generating an importance score, which represents a frequency of an occurrence of the defect pattern, and executing the training of the defect detection model using the defect data of the defect pattern when the importance score exceeds the first threshold value, and deleting the defect data when the importance score does not exceed the first threshold.
Bibliography:Application Number: US202318357475