MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND COMPUTER PROGRAM

An easy-to-maintain measurement system including a first sensor that measures a target and outputs a predetermined physical quantity, a second sensor that measures the target and outputs the same type as the predetermined physical quantity, and a processor configured to (1) acquire a first value fro...

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Bibliographic Details
Main Authors MATSUMOTO, Hisanori, YAMADA, Masuyoshi, SERIZAWA, Yasutaka
Format Patent
LanguageEnglish
Published 01.08.2024
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:An easy-to-maintain measurement system including a first sensor that measures a target and outputs a predetermined physical quantity, a second sensor that measures the target and outputs the same type as the predetermined physical quantity, and a processor configured to (1) acquire a first value from the first sensor and a second value from the second sensor, (2) convert the first value to the value of the physical quantity by a first calibration data, (3) calculate second calibration data for the second sensor from the second value and the predetermined physical quantity obtained in step (2), (4) convert the second value to the physical quantity by the second calibration data, and (5) detect the state of the measurement target by an estimation model and the physical quantity obtained in step (4).
Bibliography:Application Number: US202318370079