COMPUTATIONAL SHEAR BY PHASE STEPPED SPECKLE HOLOGRAPHY

A method of producing a pair of simultaneous artificial specklegram images. The method includes steps of: reflecting a target illumination beam off of a target surface via a transmitter optical component of a shearography system; directing a first reference beam from the transmitter optical componen...

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Bibliographic Details
Main Author Acker, Andrew N
Format Patent
LanguageEnglish
Published 01.08.2024
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Abstract A method of producing a pair of simultaneous artificial specklegram images. The method includes steps of: reflecting a target illumination beam off of a target surface via a transmitter optical component of a shearography system; directing a first reference beam from the transmitter optical component to a receiving optical component of the shearography system; directing a second reference beam from the transmitter optical component to the receiving optical component; receiving a reflected beam from the target surface with the receiving optical component; interfering the reflected beam with the first reference beam and the second reference beam; communicating a first data set relating to the pair of simultaneous artificial specklegram images from the receiving optical component to a processor; and processing the first data set to generate the pair of simultaneous artificial specklegram images.
AbstractList A method of producing a pair of simultaneous artificial specklegram images. The method includes steps of: reflecting a target illumination beam off of a target surface via a transmitter optical component of a shearography system; directing a first reference beam from the transmitter optical component to a receiving optical component of the shearography system; directing a second reference beam from the transmitter optical component to the receiving optical component; receiving a reflected beam from the target surface with the receiving optical component; interfering the reflected beam with the first reference beam and the second reference beam; communicating a first data set relating to the pair of simultaneous artificial specklegram images from the receiving optical component to a processor; and processing the first data set to generate the pair of simultaneous artificial specklegram images.
Author Acker, Andrew N
Author_xml – fullname: Acker, Andrew N
BookMark eNrjYmDJy89L5WQwd_b3DQgNcQzx9Pdz9FEI9nB1DFJwilQI8HAMdlUIDnENCHB1UQgOcHX29nFV8PD38XcPcgzwiORhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGRiZGpqZG5saOhsbEqQIA-tYrCA
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID US2024255273A1
GroupedDBID EVB
ID FETCH-epo_espacenet_US2024255273A13
IEDL.DBID EVB
IngestDate Fri Sep 06 06:16:01 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US2024255273A13
Notes Application Number: US202418613522
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240801&DB=EPODOC&CC=US&NR=2024255273A1
ParticipantIDs epo_espacenet_US2024255273A1
PublicationCentury 2000
PublicationDate 20240801
PublicationDateYYYYMMDD 2024-08-01
PublicationDate_xml – month: 08
  year: 2024
  text: 20240801
  day: 01
PublicationDecade 2020
PublicationYear 2024
RelatedCompanies BAE Systems Information and Electronic Systems Integration Inc
RelatedCompanies_xml – name: BAE Systems Information and Electronic Systems Integration Inc
Score 3.5508943
Snippet A method of producing a pair of simultaneous artificial specklegram images. The method includes steps of: reflecting a target illumination beam off of a target...
SourceID epo
SourceType Open Access Repository
SubjectTerms MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Title COMPUTATIONAL SHEAR BY PHASE STEPPED SPECKLE HOLOGRAPHY
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240801&DB=EPODOC&locale=&CC=US&NR=2024255273A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1La8MwDBale962bGOPbhg2cgvr280hjDRxCYM2Jo_RnkrjJlAYaVky9vcnu-nWU2-2BMIWSLJs6TPAS4JBeEmzltGmWSKvblLDNBfCyITEcqEia20LZCd9L-6-T3vTGnzuemEUTuiPAkdEixJo76Xy15v_SyxX1VYWr8kKSeu3UWS5epUdS7wuzI3docW47_qO7jhWHOqTQPHaCm3MxlzpCIdUpW0fQ9mXstkPKqMLOOYoLy8voZbmGpw5u7_XNDgdV0_eGpyoGk1RILGyw-IKqOOPeRxVSLYk9JgdkOGMcM8OGQkjxjlzSciZPIAS9VgU2NybXcPziEWOZ-Ba5n9bn8fh_sI7N1DP13l6C6S5QDeWUWq2RKfbS8UiS015lOg3UfHLweAOGock3R9mP8C5nG4L3RpQL7--00cMvmXypHT2C3TGgcc
link.rule.ids 230,309,783,888,25577,76883
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5KfdSbVqVq1QWlt2DfSQ5F0mRL1DZZmkTaU0i2CQiSFhvx7zu7TbWnXmdgmR2Y9-y3AI8xBuGFmraUtprGonWTKLoecSXlAstF5WlrsyDr9O2g-zrrzUrwuX0LI3FCfyQ4IloUR3vPpb9e_TexLLlbuX6KP5C0fB75A6tRVMcCrwtrY2s4oMy1XLNhmoPAazhTyWtLtDEDa6UDTLI1WSy9D8W7lNVuUBmdwiHD87L8DEpJVoWKuf17rQrHk2LkXYUjuaPJ10gs7HB9DqrpTljgF0i2xLOpMSXDOWG24VHi-ZQxahGPUZGAEjksmhrMnl_Aw4j6pq2gLOHf1cPA2xW8cwnlbJklNSDNCN1Yqqp6i3e6vYRHaaKLVKLfRMUvNO0K6vtOut7PvoeK7U_G4fjFebuBE8HaLL3VoZx_fSe3GIjz-E7q7xey9oS3
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=COMPUTATIONAL+SHEAR+BY+PHASE+STEPPED+SPECKLE+HOLOGRAPHY&rft.inventor=Acker%2C+Andrew+N&rft.date=2024-08-01&rft.externalDBID=A1&rft.externalDocID=US2024255273A1