COMPUTATIONAL SHEAR BY PHASE STEPPED SPECKLE HOLOGRAPHY

A method of producing a pair of simultaneous artificial specklegram images. The method includes steps of: reflecting a target illumination beam off of a target surface via a transmitter optical component of a shearography system; directing a first reference beam from the transmitter optical componen...

Full description

Saved in:
Bibliographic Details
Main Author Acker, Andrew N
Format Patent
LanguageEnglish
Published 01.08.2024
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:A method of producing a pair of simultaneous artificial specklegram images. The method includes steps of: reflecting a target illumination beam off of a target surface via a transmitter optical component of a shearography system; directing a first reference beam from the transmitter optical component to a receiving optical component of the shearography system; directing a second reference beam from the transmitter optical component to the receiving optical component; receiving a reflected beam from the target surface with the receiving optical component; interfering the reflected beam with the first reference beam and the second reference beam; communicating a first data set relating to the pair of simultaneous artificial specklegram images from the receiving optical component to a processor; and processing the first data set to generate the pair of simultaneous artificial specklegram images.
Bibliography:Application Number: US202418613522