USING SURROGATE NETLISTS FOR VARIATION ANALYSIS OF PROCESS VARIATIONS

In some aspects, surrogate netlists are used instead of the actual netlist of interest (the target netlist) in order to speed up the runtime for variation analysis. It is desired to characterize the distribution of a circuit's response as a function of process variation, in a tail region of the...

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Bibliographic Details
Main Authors Dai, Han-Sen, McKenzie, Todd Gordon, Singhal, Kishore, Alawieh, Mohamed Baker
Format Patent
LanguageEnglish
Published 11.07.2024
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:In some aspects, surrogate netlists are used instead of the actual netlist of interest (the target netlist) in order to speed up the runtime for variation analysis. It is desired to characterize the distribution of a circuit's response as a function of process variation, in a tail region of the distribution. The tail region of the distribution is located by performing a variation analysis based on samples generated by circuit simulations of one or more transistor-level surrogate netlists. The circuit simulations of the surrogate netlists have shorter runtimes than circuit simulations of the target netlist, resulting in a decrease of the overall runtime. The distribution in the tail region is then characterized based on samples generated by circuit simulations of the actual target netlist.
Bibliography:Application Number: US202318152069