BACK GATE ION-SENSITIVE FIELD EFFECT TRANSISTOR SENSING WITH STACKED HIGH-K NANOSHEETS
A device for analyte sensing and method of forming the device. The device includes a first semiconductor layer including a source region, a drain region and a stack of semiconductor nanosheets extending between the source region and the drain region; a first dielectric layer on the semiconductor lay...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
04.07.2024
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Subjects | |
Online Access | Get full text |
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Summary: | A device for analyte sensing and method of forming the device. The device includes a first semiconductor layer including a source region, a drain region and a stack of semiconductor nanosheets extending between the source region and the drain region; a first dielectric layer on the semiconductor layer; and a cavity extending through the first dielectric layer and the first semiconductor layer. The semiconductor nanosheets are disposed within the cavity, and a portion of the cavity resides in between the semiconductor nanosheets. |
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Bibliography: | Application Number: US202318149200 |